for the areas near proposed rectenna sites, hemispherical SPS power densities for multiple satellite systems, and mitigation techniques, and present recommendations for the various interfered system categories. The second series will contain guidelines for EMC analyses of future system deployments in the rectenna areas to assure acceptable performance. 4.1.2 State of Knowledge The EMC evaluation program uses various propagation models to determine SPS illumination power at specific locations and general areas within the continental United States, and equipment/system functional models to derive signal-to-interference degradation characteristics for the SPS primary and harmonic emissions. The propagation modes cover line-of-sight attenuation, hydrometeor and particulate attenuation and scatter, atmosphere anomaly refraction, and terrain and structural reflections. Mainly because of the high power level of the SPS, limited media model refinements are required for particulate scatter and anomaly refractive effects. System degradation models for communications, radar, and other radio frequency components are adequate for military, industrial, and commercial applications. These models include in-channel and out-of-band interference effects. Existing coupling and effect descriptors for optical and electromagnetic sensors, and various computer and processing/control circuitry (distributed and integrated circuit configurations) provide an adequate base for the initial analyses. Additional measurements will be made so that modular effects can be sufficiently defined to support realistic specification of mitigation techniques. These measurements and sensitivity testing, using existing functional and circuit models, are also necessary to support the cost-benefit trade-off exercises for the mitigation techniques. The SPS system data required for these electromagnetic compatibility analyses are provided by the SPS concept definition program. Data required encompass satellite spectral and spatial emission characteristics, rectenna candidate locations and functional parameters, and control processes.
RkJQdWJsaXNoZXIy MTU5NjU0Mg==